具有革命性的内置真空技术的手持式 XRF，世界上最“聪明”的手持式XRF变得更“聪明”了。
LZX 系列能同时测量合金、粉尘、矿石、液体等物质中的Mg、Al、Si、P和其它的20多种元素。
具有革命性的，来自INNOV-X 正在专利审查中的内在真空技术。
Innov-X LZX在样本和检测器之间创造出一个真空区域，这样独特的设计可以使微弱的X光快速进行重复的测试，这些X光是从一些比如Al,、Si 和Mg等轻元素中反射出来的。
- 只需连接vac-purge设备10秒，断开后即可开始进行测试；
- 灵活的软件自动选择最合适的测试条件；
- 内置的真空管每次均可连续使用数小时；
现在仪器的分析范围已经包括了Al, Si和Mg元素。
从我们的多重光束能量开始，LZX 系列拥有更快的测试速度和更好的人体工程学设计，使用寿命更长，且100%与以前的产品兼容。
规格说明：
- 重量：2.65 lbs（基本重量），带电池约重3.375 lbs.(1.6kg)；
- X射线源：X-射线管，Mo正极，电压最高可达40 KeV，5个过滤器；
- 检测器：Si 二极管检测器，分辨率<180 eV FWHM ，5.95 KeV；
- 工作温度：﹣10℃到﹢50℃；
- 操作：扳机或开始/停止键，一触式扳机或选择“deadman”扳机，或选择用外部电脑进行控制；
- 电源：可充电锂电池(包括充电器)，AC转换器(可选)
- 电池使用时间：8小时(一般工作循环)；
- 真空泵使用时间：充满电后平均可以持续使用6小时，再充电时间少于1分钟；
- 可测元素：标准库包含的21种元素，再加上Mg、Si和Al，用户还可以添加另外4种元素；
|
Analysis of Mg, Al, Si, and P in
Alloys with Handheld XRF |
|
The Innov-X Solution:
Innov-X has created a very novel, user friendly approach to measuring magnesium (Mg), aluminum (Al), silicon (Si), and phosphorus (P) in alloys. Our patent-pending solution integrates a small vacuum chamber inside the analzyer, sealed to the detector, front window of the XRF and the x-ray tube. The operator attaches a portable pump to the valve on the XRF, pumps for approximately 5 seconds, and detaches. As the vacuum is retained for over 6 hours, operators do not have to carry a vacuum pump or have a pump attached to the analyzer. |
|
How it Works:
A small pressure sensor inside the analyzer continuously monitors the vacuum quality. When the pressure exceeds acceptable levels, the operator is alerted to re-connect to the portable pump to refresh the internal chamber. The pump is battery powered and completely portable. The operator may also tap the Vacuum Icon on the screen to check the internal pressure as well. |
|
Why it’s Better:
Compare the Innov-X solution to competing portable XRFs. Innov-X offers several advantages: |
- There is no need to wear a heavy tank of high pressure compressed gas on your back. Carrying pressurized gas is unwieldy at best, dangerous at worst.
- No consummables cost. Based on typical XRF duty cycles, using He gas will cost up to $10,000 annually just for helium replenishment.
- There is no need to have a vacuum pump constantly attached to the analyzer, which limits portability and ease of use.
- In one competing model, the sample face being analyzed is also under vacuum. This means for each sample the operator must bring the front end up to atmospheric pressure, change samples, pump down the chamber. This requirement greatly reduces sample throughput for only modest gains in performance.
|
|
|
